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Advances in X-Ray Analysis: Volume 38

Advances in X-Ray Analysis: Volume 38

Robert L. Snyder, Bin-Jiang Chen (auth.), Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith (eds.)
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Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The 'DoubleVoigt' Approach (D. Balzar). In vivo Xray Fluorescence of Lead and Other Toxic Trace Elements (D.R. Chettle). Xray Diffraction Analysis of PM10 Aerosols Extracted by Ultrasound (B.L. Davis, H. Chen). Total Electron Yield (TEY): A New Approach for Quantitative Xray Analysis (H. Ebel). Manufacture and Use of Setting Up Samples (F.R. Feret). Applied Crystallography in the Scanning Electron Microscope Using a CCD Detector (R.P. Goehner, J.R. Michael). Trace Analysis by TXRF (R.S. Hockett). An in situ XRD Technique for Annealing Investigations (D.E. Hoylman, S.C. Axtell). Adaptation of the EGS4 Monte Carlo Code for the Design of a Polarized Source for Xray Fluorescence Analysis of Platinum and Other Heavy Metals in vivo (D.G. Lewis). 3D Graphing of XRF Matrix Correction Equations (A.J. Klimasara). Environmental Factors Contributing to the Body Burden of Lead as Determined by in vivo Xray Fluorescence (S.J.S. Ryde). Investigation of Residual Stresses in a Sleeve Coldworked Lug Specimen by Neutron and Xray Diffraction (R. Lin). Picosecond Xray Diffraction: System and Applications (P.M. Rentzepis). The Characterization of Microtexture by Orientation Mapping (R.A. Schwarzer). 79 additional articles. Index.
카테고리:
년:
1995
출판사:
Springer US
언어:
german
페이지:
1995
ISBN 10:
1461517974
ISBN 13:
9781461517979
파일:
PDF, 51.07 MB
IPFS:
CID , CID Blake2b
german, 1995
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