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Value analysis tear-down : a new process for product...

Value analysis tear-down : a new process for product development and innovation

Kaufman, J. Jerry, Sato, Yoshihiko
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This book presents, for the first time, a new technology for improving products and innovating new and better products, first developed in Japan by Yoshihiko Sato. Value analysis tear-down combines traditional tear-down with the technologies of value analysis and value engineering. Within a few years of its public announcement in Japan, value analysis tear-down was adopted by all eleven Japanese automobile manufacturers, and many of the Japanese consumer electronics manufacturers. Jerry Kaufman, based in Houston, Texas, is a recognized authority and author on value engineering and value management, and has contributed much that is in these technologies to the process described in this book. The result of his collaboration with Mr. Sato is a process that helps engineers and managers reduce product cost, improve quality, continuously improve existing products, and discover opportunities for innovative change.

The first "how-to-do-it" book in English, it is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing executives, and research and development executives. It will also be useful to manufacturing, marketing, and management people concerned with product improvement, innovation, and improving their company's competitive position. Value analysis tear-down can be applied in many service and other industries, as well as in manufacturing; wherever there are physical components to be improved or invented.

카테고리:
년:
2005
판:
1st ed
출판사:
Industrial Press, Society of Manufacturing Engineers
언어:
english
페이지:
206
ISBN 10:
1615835792
ISBN 13:
9781615835799
파일:
PDF, 8.81 MB
IPFS:
CID , CID Blake2b
english, 2005
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